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Technical Service

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Our qualified specialists are expert in preparation and examination of materials in order to characterize them.

Matrix, Inc. cover wide variety of instruments to achieve the most complete characterizations.

We are able to perform advanced characterization of materials including:


Scanning Tunneling Microscopy (STM)

Scanning Probe Microscopy (SPM)

Scanning Electron Microscopy (SEM)

Transmission Electron Microscopy (TEM)

Atomic Force Microscopy (AFM)

Energy Dispersive X-ray Spectroscopy (EDX)

Fourier Transform Infrared Spectroscopy (FTIR)

X-ray Diffraction (XRD)

Power Spectral Density Analysis (PSD)

Nuclear Magnetic Resonance Spectroscopy (NMR)

X-ray Photoelectron Spectroscopy (XPS)

Vibrating Sample Magnetometry (VSM)

Differential Scanning Calorimetry (DSC)

Texture Analysis with Electron Back Scatter Diffraction (EBSD)

Thermogravimetri Analysis (TGA)


MS Spectroscopy Analysis:

Fast Atom Bombardment (FAB-MS)

Matrix-assisted Laser Desorption/Ionization (MALDI-MS)

Electrospray Ionization (ESI-MS)


Advanced Biological Assays:

Cell & Tissue Imaging Core (Laser-Scanning Confocal Microscopy and Inverted Fluorescence Microscopy analysis)

Immunohistochemical analysis of biological samples

Cell Staining (IHC, ICC, IF)

Protein Assay (Western blot, Proteomics, Protein Array)

Gene Assay (Real Time PCR, Plasmid Constraction, DNA Microarray)


Some of our recent advanced characterization of materials are shown below:


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For request of TEM analysis, please download the following form and send to us:

http://www.matrix-inc.com/Application






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