Technical Service
Matrix HT, Inc. covers wide variety of instruments to achieve the most complete characterizations.
Our qualified specialists are expert in preparation and examination of materials in order to characterize them.
We are able to perform advanced characterization of materials including:
- Scanning Tunneling Microscopy (STM)
- Scanning Probe Microscopy (SPM)
- Scanning Electron Microscopy (SEM)
- Transmission Electron Microscopy (TEM)
- Atomic Force Microscopy (AFM)
- Energy Dispersive X-ray Spectroscopy (EDX)
- Fourier Transform Infrared Spectroscopy (FTIR)
- X-ray Diffraction (XRD)
- Power Spectral Density Analysis (PSD)
- Nuclear Magnetic Resonance Spectroscopy (NMR)
- X-ray Photoelectron Spectroscopy (XPS)
- Vibrating Sample Magnetometery (VSM)
- Differential Scanning Calorimetry (DSC)
- Texture Analysis with Electron Back Scatter Diffraction (EBSD)
- Thermogravimetric Analysis (TGA)
MS Spectroscopy Analysis:
- Fast Atom Bombardment (FAB-MS)
- Matrix-assisted Laser Desorption/Ionization (MALDI-MS)
- Electrospray Ionization (ESI-MS)
Advanced Biological Assays:
- Cell & Tissue Imaging Core (Laser-Scanning Confocal Microscopy and Inverted Fluorescence Microscopy analysis)
- Immunohistochemistry analysis (IHC) of biological samples
- Cell Staining (IHC, ICC, IF)
- Protein Assay (Western blot, Proteomics, Protein Array)
- Gene Assay (Real Time PCR, Plasmid Construction, DNA Microarray)
Some of our recent advanced characterizations of materials are shown below:
For request of above analysis, please contact us and send your specific message.